Workflow and Practical Guidance for Identical Location Scanning Electron Microscopy: Reliable Tracking of Localized...

Area of Science:

• Materials Science
• Nanotechnology
• Surface Science

Background:

• Understanding nanoscale material transformations is crucial for advancements in electrocatalysis and energy storage.
• Conventional SEM imaging often fails to distinguish real changes from sample heterogeneity due to random site selection.

Purpose of the Study:

• To provide a practical guide for implementing Identical Location SEM (IL-SEM) reliably.
• To demonstrate the versatility and accessibility of IL-SEM for materials research.

Main Methods:

• Detailed methodology for sample alignment, multiscale imaging, and consistent re-localization in IL-SEM.
• Integration of IL-SEM with energy-dispersive spectroscopy (EDS) and electron backscatter diffraction (EBSD).

Main Results:

• IL-SEM enables clear visualization of localized changes in morphology, structure, and composition by re-imaging identical sample locations.
• Case studies showcase IL-SEM's application in electrocatalysts, alloys, and nanostructured materials.
• Combined IL-SEM with EDS/EBSD allows tracking of compositional and crystallographic evolution alongside morphological changes.

Conclusions:

• IL-SEM is a powerful, non-destructive technique for studying dynamic material behavior.
• This optimized workflow can establish IL-SEM as a standard method for investigating structural evolution in diverse materials.