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In Situ Transmission Electron Microscopy with Biasing and Fabrication of Asymmetric Crossbars Based on Mixed-Phased a-VOx
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Dual-mode switching of a bidirectional self-rectifying Ti/HfO2/Ti device for bipolar and electronic complementary

Hyun Young Kim1, Néstor Ghenzi1, Hyungjun Park1

  • 1Department of Materials Science and Engineering and Inter-University Semiconductor Research Center, Seoul National University, Gwanak-ro 1, Gwanakgu, Seoul 08826, Republic of Korea. tagyun@snu.ac.kr.

Nanoscale Horizons
|August 14, 2025
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