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Determining 3D Flow Fields via Multi-camera Light Field Imaging

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Large Field-of-View Ptychographic Reconstruction of Tilted Surfaces with Adaptive Free Path.

Jizhe Cui^1,2,3, Yi Zheng^1,2,3, Kang Sun^1,2,3

¹School of Materials Science and Engineering, Tsinghua University, Beijing, 100084, China.

|August 22, 2025

Summary

Adaptive free-path ptychography (AFP) overcomes image degradation in tilted samples. This new method enhances material microstructure analysis and broadens the use of ptychographic tomography for planar samples.

Keywords:

adaptive free‐path ptychography high‐quality imaging large field‐of‐view imaging ptychography surface morphology

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Area of Science:

Materials Science
Electron Microscopy
Imaging Techniques

Background:

Atomic-resolution imaging of solids often requires tilting the sample surface.
Sample tilting leads to electron beam path variations in vacuum, degrading image quality, particularly in ptychography over large fields of view.
Existing methods struggle to correct for these free-path variations during reconstruction.

Purpose of the Study:

To develop a novel ptychographic method that corrects for electron beam path variations caused by sample tilting.
To improve image quality and enable accurate analysis of material microstructure, even with tilted samples.
To expand the applicability of ptychographic tomography for planar materials.

Main Methods:

Introduction of adaptive free-path ptychography (AFP).
Decoupling the electron beam's free path from the 4D data during ptychographic reconstruction.
Implementation of AFP for analyzing 2D materials and nanomaterials.

Main Results:

AFP effectively mitigates image quality degradation caused by sample tilting.
The method allows for precise determination of 2D material rumpling and surface morphology of nanomaterials.
Successful acquisition of high-quality, large field-of-view images from tilted samples.

Conclusions:

Adaptive free-path ptychography (AFP) is a robust solution for imaging tilted samples at atomic resolution.
AFP significantly enhances the understanding of material microstructure by enabling detailed surface and structural analysis.
AFP is expected to drive the broader adoption of ptychographic tomography in the characterization of planar materials.