Super-resolution Fluorescence Microscopy
Phase Contrast and Differential Interference Contrast Microscopy
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Updated: Sep 10, 2025

Implementation of a Reference Interferometer for Nanodetection
Published on: April 26, 2014
Chiara Lombardo1, Andrea Sottini1, Sarina Seiter1
1Nanophotonic Systems Laboratory, Department of Mechanical and Process Engineering, ETH Zurich, Tannenstrasse 3, Zurich 8092, Switzerland.
This study shows how partial coherence improves label-free microscopy for detecting single nanoparticles. Tuning partial coherence enhances sensitivity and throughput in techniques like interferometric scattering microscopy (iSCAT).
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