Semiconductors
Electro-mechanical Systems
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Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
Published on: December 5, 2015
1a, Department of Physics, University of Gujrat Gujrat Pakistan aliajabeen777@gmail.com.
This study explores a novel inorganic molecular crystal (IMC), revealing its electronic and structural properties. The (001) surface shows potential for nano-electronic devices like field-effect transistors (FETs).
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