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Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating
Published on: October 11, 2016
Phase-Biased Andreev Diffraction Grating
Magnus R Lykkegaard1, Anders Enevold Dahl1, Tyler Lindemann2,3
1University of Copenhagen, Niels Bohr Institute, Center for Quantum Devices, DK-2100 Copenhagen, Denmark.
Abstract:
In optical diffraction, the phase difference between sources in a grating or multislit mask is determined by the angle to the imaging screen, yielding the familiar multilobed diffraction image. Here, we realize a similar phenomenon in a superconductor-semiconductor hybrid circuit configured to allow Andreev scattering from multiple parallel scatterers. Phase differences between scatterers are set by tapping off of a remote superconducting meander. We investigate arrays with two, three, four, and ten Andreev scatterers, examining local and nonlocal diffraction patterns, finding good agreement with a theory of multiple Andreev scattering, not to be confused with multiple Andreev reflection. Adding current-carrying taps to the meander allows individual phase control.

