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Total Ionizing Dose Effect Simulation Modeling and Analysis for a DCAP Power Chip

Xinfang Liao1, Danyang Lei1, Yanjun Fu2

  • 1Guangzhou Institute of Technology, Xidian University, Guangzhou 510555, China.

Micromachines
|August 28, 2025
PubMed

Keywords:
fault injection modelpower chipradiation sensitivity analysistotal ionizing dose effect

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