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Updated: Aug 5, 2026

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
Published on: May 28, 2016
Editorial for Special Issue "High-Reliability Semiconductor Devices and Integrated Circuits, 3rd Edition"
Changqing Xu1,2, Yi Liu2, Yiqiang Chen3
1Guangzhou Institute of Technology, Xidian University, Guangzhou 510555, China.
Semiconductor devices are crucial for safety-critical systems like automobiles and aerospace. Ensuring their reliability in harsh environments is essential for mission success.
Area of Science:
- Materials Science
- Electrical Engineering
- Computer Engineering
Background:
- Semiconductor devices and integrated circuits are vital components in numerous safety-critical applications.
- These applications include automobiles, avionics, aerospace, radiation monitoring, and high-power optoelectronics.
- The increasing deployment necessitates a focus on device reliability and performance.
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