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Reduction of Visual Artifacts in Laser Beam Scanning Displays
Peng Zhou1,2, Huijun Yu2, Xiaoguang Li2
1School of Nano-Tech and Nano-Bionics, University of Science and Technology of China, Hefei 230026, China.
Micromachines
|August 28, 2025
Summary
This study introduces random variations in laser beam scanning (LBS) systems to eliminate dark bands and improve image uniformity. The enhanced scanning method significantly reduces display artifacts for a better viewing experience.
Area of Science:
- Optics and Photonics
- Display Technologies
- Micro-Electro-Mechanical Systems (MEMS)
Background:
- Laser beam scanning (LBS) projection systems using MEMS micromirrors are valuable for AR glasses and portable projectors due to their size and power efficiency.
- Raster scanning, a common LBS method, produces artifacts like dark bands and non-uniform line spacing, degrading image quality.
- Existing LBS systems lack methods to mitigate these scanning artifacts effectively.
Purpose of the Study:
- To address and eliminate scanning artifacts in MEMS-based LBS projection systems.
- To improve the scanning fill factor and uniformity of displayed images.
- To enhance the overall visual experience in LBS projection applications without hardware changes.
Main Methods:
- Introduced random variations to the slow-axis driving signal of MEMS micromirrors.
- Altered the vertical offset of scanning trajectories between successive scan cycles.
- Utilized the temporal integration effect of human vision for trajectory overlap and fill factor enhancement.
Main Results:
- Reduced the maximum non-uniform line spacing ratio from 7:1 to 1:1.
- Lowered the modulation of the scanned display image to 0.0006, below the human contrast threshold of 0.0039.
- Successfully eliminated dark bands and improved scanning trajectory distribution.
Conclusions:
- The proposed method effectively mitigates scanning display artifacts in LBS systems.
- Randomizing the slow-axis signal enhances the scanning fill factor and image uniformity.
- This technique offers a hardware-free solution for improving MEMS-based LBS projection quality.

