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Microfluidic Chips for In Situ Crystal X-ray Diffraction and In Situ Dynamic Light Scattering for Serial Crystallography
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Multi-modal impedance and X-ray characterization enables simultaneous detection of bulk and interfacial

Nikolaus Doppelhammer1,2, Daniel Spira3, Anjul Rais2

  • 1NMRCoRe-NMR/X-Ray platform for Convergence Research, KU Leuven, Leuven 3001, Belgium. nikolaus.doppelhammer@kuleuven.be.

Chemical Communications (Cambridge, England)
|September 2, 2025
PubMed
Abstract

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