Daniel Spira

1PUBLICATIONS

6CO-AUTHORS

Elemental semiconductors

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Publications (1)

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|Sep 02, 2025

Multi-modal impedance and X-ray characterization enables simultaneous detection of bulk and interfacial crystallization.

Nikolaus Doppelhammer, Daniel Spira, Anjul Rais

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Frequent Collaborators

1 joint publications

Nikolaus Doppelhammer

1 joint publications

Anjul Rais

1 joint publications

Dries Vandenabeele

1 joint publications

Charles McMonagle

1 joint publications

Dmitry Chernyshov

1 joint publications

Eric Breynaert

Frequent Collaborators

1 joint publications

Nikolaus Doppelhammer

1 joint publications

Anjul Rais

1 joint publications

Dries Vandenabeele

1 joint publications

Charles McMonagle