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Updated: Sep 9, 2025

Microfluidic Chips for In Situ Crystal X-ray Diffraction and In Situ Dynamic Light Scattering for Serial Crystallography
Published on: April 24, 2018
Multi-modal impedance and X-ray characterization enables simultaneous detection of bulk and interfacial
Nikolaus Doppelhammer1,2, Daniel Spira3, Anjul Rais2
1NMRCoRe-NMR/X-Ray platform for Convergence Research, KU Leuven, Leuven 3001, Belgium. nikolaus.doppelhammer@kuleuven.be.
Abstract:
A multi-modal platform enabling simultaneous impedance spectroscopy and X-ray scattering is presented. When applied to zeolite crystallization, four-electrode impedance measurements reliably track bulk crystallization kinetics in agreement with X-ray diffraction, while two-electrode impedance data reveal artefacts from electrode passivation.
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