Non-Destructive Evaluation of HTV's Thermal-Oxidative Aging Using Terahertz Dielectric Spectroscopy

Thermal oxidative aging failure of high-temperature vulcanized silicone rubber (HTV) in high-voltage insulators is the core hidden danger of power grid security. In this study, terahertz time domain spectroscopy (THz-TDS) and attenuated total reflection infrared spectroscopy (ATR-FTIR) were combined to reveal the quantitative structure-activity relationship between dielectric response and chemical group evolution of HTV during accelerated aging at 200 °C for 80 days. In this study, HTV flat samples were made in the laboratory, and the dielectric spectrum of HTV in the range of 0.1 THz to 0.4 THz was extracted by a terahertz time-domain spectrum platform. ATR-FTIR was used to analyze the functional group change trend of HTV during aging, and the three-stage evolution of the dielectric real part (0.16 THz), the dynamics of the carbonyl group, the monotonic rise of the dielectric imaginary part (0.17 THz), and the linear response of silicon-oxygen bond breaking were obtained by combining the double Debye relaxation theory. Finally, three aging stages of HTV were characterized by dielectric loss angle data. The model can warn about the critical point of early oxidation and main chain fracture and identify the risk of insulation failure in advance compared with traditional methods. This study provides a multi-scale physical basis for nondestructive life assessment in a silicon rubber insulator.