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Development of Simple and Affordable Integrating Device for Accurate LED Strip Light Measurement
Krzysztof Skarżyński1, Tomasz Krzysztoń2
1Lighting Technology Division, Electrical Power Engineering Institute, Warsaw University of Technology, Koszykowa 75, 00-662 Warsaw, Poland.
Abstract:
LED strips are increasingly used as lighting sources in public and private spaces. However, traditional photometric methods, such as integrating spheres, are unsuitable for measuring their light parameters, often resulting in significant errors and requiring expensive instrumentation or calibration. These errors are typically caused by non-uniform illumination of the internal surface or improper internal geometry, especially when measuring LED sources. This article presents the development of a low-cost integrating device specifically designed to measure LED strips' light parameters. The device is a compact cube with a volume of less than 1.0 m3. It was tested against alternative methods using an integrating sphere and a goniophotometer in a professional photometric laboratory. The verification results confirmed its effectiveness. The device showed the maximum relative error of luminous flux measurement to be around 5% compared with the accurate, expensive goniophotometric method. For colorimetric measurements, the maximum Correlated Color Temperature (CCT) absolute error was about 35 K for an LED strip with a CCT of 4000 K, indicating a difference imperceptible to the human eye. These results demonstrate the device's proper relevance in the research and development of LED strip-based lighting equipment to improve lighting equipment quality and control processes. The device is easy to replicate, significantly reducing production and transportation costs, making it an excellent solution for companies and research units seeking a cost-effective method for LED strip measurements. Additionally, the device can measure other light sources or luminaires with reasonably small sizes emitting light in only one hemisphere. The device is the basis of a patent application.

