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Updated: Jan 17, 2026

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
Published on: May 28, 2016
Chaolu Niu1, Potao Sun1, Wenxia Sima1
1State Key Laboratory of Power Transmission Equipment Technology, Chongqing University, Chongqing, 400044, P. R. China.
A new method uses electric fields to make internal polymer defects glow, allowing for early detection before damage occurs. This technique provides 3D imaging of microscale structures in various polymers.
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