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Updated: Jan 17, 2026

Multimodal Hierarchical Imaging of Serial Sections for Finding Specific Cellular Targets within Large Volumes
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Enabling the Acquisition of Electron Beam-Induced Current (EBIC) Images in Conventional SEM and STEM Instruments

Fernando Camino1, Byeongjun Gil2,3, Armando Rúa4

  • 1Center for Functional Nanomaterials, Brookhaven National Laboratory, Upton, NY 11973, USA.

Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
|September 23, 2025
PubMed

Keywords:
electrical characterizationelectron beam-induced current imagingelectron microscopyinsulator-to-metal transition

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