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Atomic Force Microscopy

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...

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Related Experiment Video

Updated: Jan 17, 2026

Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid

Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid

Published on: December 2, 2022

Nanomechanical Characterization via Atomic Force Microscopy.

Jin Wang¹, Jun-Qi Han¹, Yong Yan¹

¹Center for Molecular Systems and Organic Devices (CMSOD), State Key Laboratory of Flexible Electronics (LoFE) and Institute of Advanced Materials (IAM), Nanjing University of Posts & Telecommunications (NJUPT), Nanjing 210023, China.

ACS Applied Materials & Interfaces

|September 25, 2025

Summary

This summary is machine-generated.

Nanomechanical mapping using atomic force microscopy (AFM-based NMM) provides high-resolution imaging for flexible electronics. This technique analyzes dynamic mechanical responses, crucial for optimizing device performance and stability.

Keywords:

AFM-based nanomechanical mapping atomic force microscopy flexible materials high-resolution imaging nanomechanical properties

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Area of Science:

Materials Science
Nanotechnology
Mechanical Engineering

Background:

Optimizing flexible electronics requires understanding their mechanical behavior at the nanoscale.
Challenges exist in measuring nanomechanical properties due to complex deformation at interfaces during mechanical stimuli.

Purpose of the Study:

To systematically review recent advances, applications, and challenges in AFM-based Nanomechanical Mapping (AFM-based NMM).
To highlight the importance of AFM-based NMM for studying nanomechanics in flexible electronics.

Main Methods:

Review of experimental methodologies for sample preparation, manipulation, and measurement in AFM-based NMM.
Examination of theoretical contact models for tip-sample interactions.
Analysis of factors influencing nanomechanical properties: size, substrate, interface effects, and anisotropy.

Main Results:

AFM-based NMM enables nondestructive, high-resolution imaging of mechanical behavior.
Real-time detection and analysis of dynamic mechanical responses under stimuli are possible.
Understanding nanomechanical properties is linked to material development and device design.

Conclusions:

AFM-based NMM is essential for advancing flexible electronic materials and devices.
Insights from AFM-based NMM are critical for optimizing performance and enhancing stability.
Further research into size, substrate, interface, and anisotropy effects will drive innovation.