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Depth Correction of TOF-SIMS Depth Profiling Images Using the Total Ion Count Images.

Melanie A Brunet1, Brittney L Gorman2, Mary L Kraft1,2

  • 1Department of Chemical and Biomolecular Engineering, University of Illinois Urbana-Champaign, Champaign, IL 61801, USA.

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Summary
This summary is machine-generated.

This study introduces a method to correct z-axis distortion in 3D depth profiling time of flight secondary ion mass spectrometry (TOF-SIMS) images of cells. Accurate 3D TOF-SIMS imaging of cellular structures like ER-PM junctions is now possible.

Keywords:
TOF-SIMS depth profilingdepth correctionendoplasmic reticulum-plasma membrane junctions

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Area of Science:

  • Cellular Biology
  • Analytical Chemistry
  • Biophysics

Background:

  • Depth profiling time of flight secondary ion mass spectrometry (TOF-SIMS) is a powerful technique for imaging metabolite distributions within cells.
  • 3D reconstructions from TOF-SIMS data often suffer from z-axis distortion, hindering accurate interpretation of cellular structures.

Purpose of the Study:

  • To develop and validate a method for correcting z-axis distortion in 3D TOF-SIMS depth profiling images of cells.
  • To improve the accuracy of 3D reconstructions for visualizing subcellular structures, specifically endoplasmic reticulum-plasma membrane (ER-PM) junctions.

Main Methods:

  • Utilized total ion images from TOF-SIMS depth profiling to construct a 3D cell surface morphology model.
  • Applied the morphology model to correct the z-position and height of voxels in component-specific 3D TOF-SIMS images.
  • Tested the correction method on 3D TOF-SIMS data of ER-PM junctions in a simplified cellular model.

Main Results:

  • The developed approach successfully corrected z-axis distortion in 3D TOF-SIMS images.
  • Depth-corrected 3D images provided a more accurate representation of ER-PM junction structures compared to uncorrected images.
  • Projection of corrected images onto the morphology model enhanced visualization of junctions relative to cell surface features.

Conclusions:

  • Accurate, component-specific 3D images can now be generated from depth profiling TOF-SIMS datasets.
  • This correction method facilitates the identification of lipids and metabolites at ER-PM junctions.
  • The findings may advance the understanding of metabolite roles in neuronal function.