Advances in Laser Linewidth Measurement Techniques: A Comprehensive Review

As a key parameter that defines the spectral characteristics of lasers, the precise measurement of laser linewidth is crucial for a wide range of advanced applications. This review systematically summarizes recent advances in laser linewidth measurement techniques, covering methods applicable from GHz-level broad linewidths to sub-Hz ultranarrow regimes. We begin by presenting representative applications of lasers with varying linewidth requirements, followed by the physical definition of linewidth and a discussion of the fundamental principles underlying its measurement. For broader linewidth regimes, we review two established techniques: direct spectral measurement using high-resolution spectrometers and Fabry-Pérot interferometer-based analysis. In the context of narrow-linewidth lasers, particular emphasis is placed on the optical beating method. A detailed comparison is provided between two dominant approaches: power spectral density (PSD) analysis of the beat signal and phase-noise-based linewidth evaluation. For each technique, we discuss the working principles, experimental configurations, achievable resolution, and limitations, along with comparative assessments of their advantages and drawbacks. Additionally, we critically examine recent innovations in ultra-high-precision linewidth metrology. This review aims to serve as a comprehensive technical reference for the development, characterization, and application of lasers across diverse spectral regimes.