Recent Progress on the Characterization of Polymer Crystallization by Atomic Force Microscopy

The crystallization behavior of polymers affects the structure of aggregated states, which influences the properties of materials. Atomic force microscopy (AFM) is a helpful characterization tool with high spatial resolution at the nanometer-to-micrometer scale and low-destruction imaging capabilities, making it an important means of studying polymer crystallography. This review is intended for scientists in polymer materials and physics, aiming to inspire how the rich applications of AFM can be harnessed to address fundamental scientific questions in polymer crystallization. This paper reviews recent advances in polymer crystallization characterization based on AFM, focusing on its applications in visualizing hierarchical polymer crystal structures (single crystals, spherulites, dendritic crystals, and shish kebab crystals), investigating crystallization kinetics (in situ monitoring of crystal growth), and analyzing structure-property relationships (structural changes under temperature and stress). Finally, we introduce the application of the latest AFM technology in addressing key issues in polymer crystallization, such as single-molecule force spectroscopy (SMFS) and atomic force microscopy-infrared spectroscopy (AFM-IR). As AFM technology advances toward higher precision, greater efficiency, and increased functionality, it is expected to deliver more exciting developments in the field of polymer crystallization.