Transmission Electron Microscopy
Fatigue
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Updated: Jan 15, 2026

Full-field Strain Measurements for Microstructurally Small Fatigue Crack Propagation Using Digital Image Correlation Method
Published on: January 16, 2019
Andrew Baker1, Kyle R Dorman2, Khalid Hattar3
1Center for Integrated Nanotechnologies, Sandia National Laboratories, Albuquerque, NM, 87123, USA.
Researchers developed a new method to control fatigue crack growth in situ Transmission Electron Microscopy (TEM) experiments. This quantitative approach allows detailed observation of nanoscale fatigue mechanisms in various materials and devices.
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