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Advancing time-resolved spectroscopies with custom scanning units and event-based electron detection.

Yves Auad¹, Florian Castioni¹, Jassem Baaboura¹

¹Laboratoire des Physique des Solides, Université Paris Saclay, Orsay, France.

Micron (Oxford, England : 1993)

|October 17, 2025

Summary

Direct electron detection with Timepix3 technology offers enhanced microscopy. A new scanning unit enables advanced, time-resolved experiments with continuous-gun electron microscopes.

Keywords:

Electron energy-loss spectroscopy Electron microscope Event-based Hybrid pixel direct detector Lissajous scanning Scanning unit Temporal resolution Timepix3

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Published on: December 8, 2016

Area of Science:

Electron Microscopy
Materials Science
Physics

Background:

Direct electron detection revolutionizes electron microscopy with improved noise, point-spread function, and quantum efficiency.
Timepix3 detectors offer unique temporal information and event-based readout for data-driven detection.

Purpose of the Study:

To develop and evaluate a custom scanning unit for Timepix3 direct electron detectors in continuous-gun scanning transmission electron microscopes (STEM).
To enable spatially and temporally resolved experiments using event-based detection with standard scanning units.
To explore enhanced temporal resolution in time-resolved electron microscopy.

Main Methods:

Design and implementation of a custom Timepix3-compatible scanning unit.
Integration with continuous-gun STEM systems.
Testing with time-resolved instruments like pulsed lasers and electron beam blankers.
Analysis of performance for spatially and temporally resolved experiments.

Main Results:

Demonstration of a functional scanning unit enabling event-based detection in STEM.
Successful interfacing with time-resolved experimental setups.
Identification of challenges and potential solutions for improving temporal resolution.

Conclusions:

The custom scanning unit effectively leverages event-based detection for advanced electron microscopy applications.
This development expands the capabilities of continuous-gun STEM for fundamental research and practical applications.
Further optimization holds promise for enhanced temporal resolution in time-resolved electron microscopy.