Advancing time-resolved spectroscopies with custom scanning units and event-based electron detection

Yves Auad1, Florian Castioni1, Jassem Baaboura1

  • 1Laboratoire des Physique des Solides, Université Paris Saclay, Orsay, France.

Micron (Oxford, England : 1993)
|October 17, 2025
PubMed
Summary

Direct electron detection with Timepix3 technology offers enhanced microscopy. A new scanning unit enables advanced, time-resolved experiments with continuous-gun electron microscopes.

Related Concept Videos

Inductively Coupled Plasma Atomic Emission Spectroscopy: Instrumentation01:26

Inductively Coupled Plasma Atomic Emission Spectroscopy: Instrumentation

Inductively coupled plasma (ICP) is the common plasma source used in atomic emission spectroscopy (AES), a technique that detects and analyzes various elements in a sample. This method is often called inductively coupled plasma atomic emission spectroscopy (ICP-AES).
There are three main types of inductively coupled plasma atomic emission spectroscopy  (ICP-AES) instruments: sequential, simultaneous multichannel, and Fourier transform instruments, with the latter being less commonly used....
648
Scanning Electron Microscopy01:07

Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
Fundamental Principles
Accelerated...
5.3K