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Updated: Jan 14, 2026

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics
Published on: January 19, 2018
Advancing time-resolved spectroscopies with custom scanning units and event-based electron detection
Yves Auad1, Florian Castioni1, Jassem Baaboura1
1Laboratoire des Physique des Solides, Université Paris Saclay, Orsay, France.
Direct electron detection with Timepix3 technology offers enhanced microscopy. A new scanning unit enables advanced, time-resolved experiments with continuous-gun electron microscopes.
Area of Science:
- Electron Microscopy
- Materials Science
- Physics
Background:
- Direct electron detection revolutionizes electron microscopy with improved noise, point-spread function, and quantum efficiency.
- Timepix3 detectors offer unique temporal information and event-based readout for data-driven detection.
Purpose of the Study:
- To develop and evaluate a custom scanning unit for Timepix3 direct electron detectors in continuous-gun scanning transmission electron microscopes (STEM).
- To enable spatially and temporally resolved experiments using event-based detection with standard scanning units.
- To explore enhanced temporal resolution in time-resolved electron microscopy.
Main Methods:
- Design and implementation of a custom Timepix3-compatible scanning unit.
- Integration with continuous-gun STEM systems.
- Testing with time-resolved instruments like pulsed lasers and electron beam blankers.
- Analysis of performance for spatially and temporally resolved experiments.
Main Results:
- Demonstration of a functional scanning unit enabling event-based detection in STEM.
- Successful interfacing with time-resolved experimental setups.
- Identification of challenges and potential solutions for improving temporal resolution.
Conclusions:
- The custom scanning unit effectively leverages event-based detection for advanced electron microscopy applications.
- This development expands the capabilities of continuous-gun STEM for fundamental research and practical applications.
- Further optimization holds promise for enhanced temporal resolution in time-resolved electron microscopy.
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