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Updated: Jan 14, 2026

Fabrication of Schottky Diodes on Zn-polar BeMgZnO/ZnO Heterostructure Grown by Plasma-assisted Molecular Beam Epitaxy
Published on: October 23, 2018
Interfacial Schottky barrier modulation in Ti3C2/B2S2 heterostructures by surface functionalization and strain
1School of Physics and Wuhan National High Magnetic Field Center, Huazhong University of Science and Technology, Wuhan 430074, China. linzh@hust.edu.cn.
Abstract:
The interfacial resistance between metals and semiconductors critically affects device performance. To gain a deeper understanding of interfacial properties and enhance device functionality, we employ first-principles calculations to explore the effects of surface functionalization and strain engineering on Ti3C2/B2S2 heterojunctions. Our findings reveal that functionalizing Ti3C2 emerges as an effective means of modulating the interfacial coupling strength. Various surface groups (T = O, F, and OH) play pivotal roles in regulating the contact type of the heterojunction. Notably, the Ti3C2F2/B2S2 and Ti3C2O2/B2S2 heterojunctions exhibit p-type Schottky contacts, while the Ti3C2(OH)2/B2S2 heterojunction achieves n-type ohmic contacts with an exceptionally high tunneling probability. Furthermore, biaxial strain proves to be a versatile tool for modulating both the contact type and tunneling probability, offering a novel and effective approach to interface engineering. These results not only deepen our understanding of Ti3C2/B2S2 heterojunctions but also provide valuable insights for developing high-performance electronic devices through strategic interface design.
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