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Updated: May 7, 2026

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
Published on: May 28, 2016
Xun Li1,2,3, Yuzhen Zhao4, Yang Zhao1
1Xi'an Key Laboratory of Advanced Photo-electronics Materials and Energy Conversion Device, School of Electronic Information, Xijing University, Xi'an, 710123, People's Republic of China.
A new Gated Unified Reparameterized Large Kernel Network (GURLKNet) improves unmanned aerial vehicle (UAV) based insulator defect detection. This method enhances accuracy and efficiency for power system safety inspections.
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