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Updated: Jan 11, 2026
08:58
Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid
Published on: December 2, 2022
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Atomic Force Microscopy Infrared Spectroscopy Method for Multisample Comparison of Topographic, Infrared Imaging, and
Kevin H Putera1, Rahul Sharma1, Victoria Haritos1
1Department of Chemical and Biological Engineering, Monash University, Clayton, Victoria 3800, Australia.
Analytical Chemistry
|November 10, 2025
Summary
This study introduces a new method for comparing nanoscale stiffness using atomic force microscopy-infrared spectroscopy. The technique standardizes contact resonance frequency measurements across different samples and tips, overcoming previous limitations.
Area of Science:
- Materials Science
- Nanotechnology
- Spectroscopy
Background:
- Atomic force microscopy-infrared spectroscopy (AFM-IR) provides nanoscale topographical, chemical, and stiffness data.
- Measuring relative sample stiffness via contact resonance frequency is challenging due to tip and cantilever variations causing absolute frequency offsets.
Purpose of the Study:
- To develop a standardized procedure for comparing contact resonance frequencies between different samples and AFM-IR setups.
- To overcome the issue of absolute frequency variation in stiffness measurements.
Main Methods:
- Utilized the phase-locked loop frequency channel in AFM-IR to assess probe-sample contact resonance.
- Developed a novel procedure to standardize contact resonance frequency comparison, circumventing absolute frequency variations.
Main Results:
- Demonstrated a reliable method for comparing nanoscale stiffness across diverse samples.
- Successfully applied the technique to carbon-epoxy composites, enzyme-functionalized cellulose amide disks, and human cadaver ligament samples.
Conclusions:
- The presented standard procedure enables accurate and comparable nanoscale stiffness measurements using AFM-IR.
- This advancement facilitates more reliable material characterization and comparative analysis in nanotechnology and materials science.
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