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Silicon Metal-oxide-semiconductor Quantum Dots for Single-electron Pumping
Published on: June 3, 2015
Integration of Quantum Dot Light-Emitting Diodes and Charge Trap Thin-Film Transistor Arrays for Memory-In-Pixel
Seoungmin Park1, Eun A Kim2, Gijun Ju1,3
1Department of Photonics and Nanoelectronics, and BK21 FOUR ERICA-ACE Center, Hanyang University, Ansan 15588, Korea.
This study introduces a novel memory-in-pixel (MIP) device integrating a charge-trap thin-film transistor (CTTFT) and a quantum dot light-emitting diode (QD-LED) for advanced displays. The self-erasing MIP offers compact, low-power, and eco-friendly pixel-level memory and light emission.
Area of Science:
- Materials Science
- Electrical Engineering
- Optoelectronics
Background:
- Ultrahigh-resolution displays and extended reality (XR) demand compact, low-power pixel architectures for integrated memory and light emission.
- Charge-trap thin-film transistors (CTTFTs) using oxide semiconductors are promising for nonvolatile memory due to performance and fabrication compatibility.
- Existing solutions often lack integrated memory and light-emission functionalities at the pixel level, necessitating novel device designs.
Purpose of the Study:
- To propose and demonstrate a novel memory-in-pixel (MIP) device monolithically integrating a CTTFT and a quantum dot light-emitting diode (QD-LED).
- To achieve self-erasing functionality within a single pixel for enhanced display performance and reduced complexity.
- To evaluate the electrical and optical performance of the integrated MIP device, including CTTFT characteristics and QD-LED efficiency.
Main Methods:
- Fabrication of a CTTFT using an Al2O3/HfO2/Al2O3 gate dielectric and an oxide semiconductor channel.
- Monolithic integration of a QD-LED atop the CTTFT using a photolithography-based lift-off process to enable self-erasing functionality.
- Characterization of CTTFT performance (mobility, subthreshold swing, on/off ratio, memory window) and QD-LED performance (external quantum efficiency - EQE, erasing efficiency).
Main Results:
- The CTTFT exhibited high field-effect mobility (22.1 cm2/V·s), a sharp subthreshold swing (99.1 mV/dec), an on/off ratio >10^9, and a wide memory window (6.06 V).
- Monolithically integrated QD-LEDs achieved significant EQEs: 20.9% (red), 6.5% (green), and 1.7% (blue).
- Cd-free ZnSeTe QD-LEDs demonstrated a notable erasing efficiency of ~60%, surpassing Cd-based counterparts and enabling self-erasing MIP operation.
Conclusions:
- The developed hybrid MIP architecture successfully integrates CTTFT memory and QD-LED emission functions within a single pixel.
- The self-erasing MIP device operates without external erase components, offering a compact and efficient solution for next-generation displays.
- This environmentally friendly platform, particularly with Cd-free QDs, is suitable for advanced, high-resolution display applications demanding integrated functionalities.
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