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Published on: April 17, 2018
Simulation of surface x-ray emission from the ASTERICS ECR ion source
T Thuillier1, A Cernuschi1, B Cheymol1
1Université Grenoble Alpes, CNRS-LPSC, INP Grenoble, Grenoble, France.
Bremsstrahlung X-ray emission from plasma electrons impacting ion source walls was simulated. Shielding strategies were developed to reduce X-ray dose to below 1 μSv h-1 per kW, ensuring operational safety.
Area of Science:
- Plasma Physics
- Particle Accelerators
- Radiation Shielding
Background:
- Electron cyclotron resonance ion sources (ECRIS) are crucial for various applications.
- De-confined plasma electrons impacting chamber walls generate bremsstrahlung X-rays.
- Understanding and mitigating this X-ray emission is vital for ECRIS safety and operation.
Purpose of the Study:
- To investigate bremsstrahlung X-ray emission from ECRIS.
- To quantify X-ray dose and its dependence on magnetic field strength (Bmin).
- To design effective shielding solutions for ECRIS.
Main Methods:
- Utilized a suite of two simulation codes for X-ray emission analysis.
- Mapped X-ray dose inside and around the ion source.
- Performed parametric studies using the Fluka simulation code.
Main Results:
- Electron temperature distribution tail at the wall is anisotropic and increases with Bmin.
- Electrons impinge walls with a broad angular distribution (5°-25°).
- X-ray dose without shielding reaches 100 μSv h-1 per kW at 5m; shielding reduces it to <1 μSv h-1 per kW.
Conclusions:
- Anisotropic electron distribution and angular impact influence X-ray emission.
- Effective internal and external shielding designs are presented.
- Simulated heat deposition aligns with experimental findings at specific electron temperatures.
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