Metal-Semiconductor Junctions
Lattice Centering and Coordination Number
Metallic Solids
Semiconductors
Fermi Level Dynamics
Network Covalent Solids
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Updated: Jan 10, 2026

Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
Published on: December 5, 2015
Li Gao1,2, Zhangyi Chen1,3, Zhenghui Fang1,3
1Academy for Advanced Interdisciplinary Science and Technology, Key Laboratory of Advanced Materials and Devices for Post-Moore Chips Ministry of Education, State Key Laboratory for Advanced Metals and Materials, University of Science and Technology Beijing, Beijing, China.
We developed an atomic layer bonding (ALB) contact for 2D semiconductors, achieving strong coupling and low resistance. This breakthrough surpasses traditional methods, enabling robust electronic device integration.
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