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Updated: Jan 10, 2026

Picometer-Precision Atomic Position Tracking through Electron Microscopy
Published on: July 3, 2021
Yan-Wei Chen1,2,3, Meng-Zhe Lian1,2,3, Jin-Jian Han1,2,3
1Hefei National Research Center for Physical Sciences at the Microscale and School of Physical Sciences, University of Science and Technology of China, Hefei 230026, China.
This study introduces a novel bistatic dual-comb ranging method for precise long-distance measurements up to 113 km. The technique overcomes noise and transmission loss, enabling accurate ranging for applications like satellite formation flying.
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