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Updated: Jan 10, 2026

Fabrication and Optimization of Type II Silicon Clathrate Films
Published on: October 14, 2025
Synthesis, Crystal Structure and Thermoelectric Properties of the Type-I Clathrate Sn38Sb8I8
Nikolaos Moutzouris1, Panagiotis Mangelis2, Nikolaos Kelaidis1
1Theoretical and Physical Chemistry Institute, National Hellenic Research Foundation, 11635 Athens, Greece.
Abstract:
Semiconducting clathrates are a distinct class of inclusion compounds with considerable interest for thermoelectric applications. We report here the synthesis, crystal structure and thermoelectric properties of Sn38Sb8I8. The compound was synthesized via planetary ball milling of the corresponding elements for 6 h and then sintering of amorphous mixture at 620 K for 3 days. The crystal structure of the polycrystalline product was determined via X-ray powder diffraction and Rietveld refinement as a type-I clathrate (a = 12.0390(2), space group Pm-3n, No. 223) with mixed-occupied Sn/Sb framework sites and fully occupied I guest sites. Further analysis on the chemical composition, nanomorphology and vibrational modes of the material was carried out via Induced-Coupled-Plasma-Mass Spectrometry, SEM/EDX microscopy and Raman spectroscopy, respectively. Thermoelectric measurements were performed on hot-pressed samples with ca. 98% of the crystallographic density. The clathrate compound behaves as an n-type semiconductor with a band gap of 0.737 eV and exhibits a maximum ZT of 0.0016 at 473 K. Theoretical calculations on the formation enthalpy, electron density of states and transport properties provide insights into the experimentally observed physical behavior.
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