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Related Concept Videos

Atomic Force Microscopy01:08

Atomic Force Microscopy

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Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
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Cross-scale high-bandwidth atomic force microscopy with a stick-slip nanopositioner.

Xiangyuan Wang1, Qi Yu1, Yixuan Meng1

  • 1State Key Laboratory of Mechanical System and Vibration, School of Mechanical Engineering, Shanghai Jiao Tong University, Shanghai, China.

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|November 26, 2025
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A new triple-phase controller enables typical stick-slip nanopositioners to achieve high-bandwidth, nano-precision scanning for atomic force microscopy (AFM). This innovation expands the working range and offers a versatile, cross-scale solution for advanced AFM systems.

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Area of Science:

  • Nanotechnology
  • Microscopy
  • Materials Science

Background:

  • Atomic Force Microscopy (AFM) relies on precise nanopositioners for tip-sample scanning.
  • Current AFM systems use direct-drive nanopositioners limited to either long range or high bandwidth, not both.

Purpose of the Study:

  • To demonstrate high-bandwidth, nano-precision scanning using a typical stick-slip nanopositioner.
  • To expand the working range of nanopositioners for AFM applications.
  • To develop a versatile stick-slip AFM system for high-resolution imaging.

Main Methods:

  • Implementation of a triple-phase controller with a stick-slip nanopositioner.
  • Leveraging displacement accumulation for extended working range.
  • Development and testing of a versatile stick-slip AFM system.

Main Results:

  • Achieved high-bandwidth (up to 363 Hz) nano-precision scanning with a stick-slip nanopositioner.
  • Demonstrated a 3 mm × 3 mm XY working range, significantly larger than comparable direct-drive systems.
  • Enabled high-line-rate AFM imaging at 40 Hz over millimeter-scale areas.

Conclusions:

  • Stick-slip nanopositioners can be adapted for high-bandwidth, nano-precision scanning in AFM.
  • This approach offers a cost-effective, cross-scale solution for next-generation AFM.
  • Expands the functional scope of stick-slip nanopositioners beyond static or coarse positioning.