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A Three-Terminal Si-Ge Avalanche Photodiode with a Breakdown Voltage of 6.8 V and a Gain Bandwidth Product of 1377
Chao Cheng1, Jintao Xue1, Xishan Yu1
1State Key Laboratory of Ultrafast Optical Science and Technology, Xi'an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi'an 710119, China.
Abstract:
Silicon-germanium (Si-Ge) avalanche photodiodes (APDs), fully compatible with complementary metal-oxide-semiconductor (CMOS) processes, are critical devices for high-speed optical communication. In this work, we propose a three-terminal Si-Ge APD on a silicon-on-insulator (SOI) substrate based on device simulation studies. The proposed APD employs a separate absorption and multiplication structure, achieving an ultra-low breakdown voltage of 6.8 V. The device operates in the O-band, with optical signals laterally coupled into the Ge absorption layer via a silicon nitride (Si3N4) waveguide. At a bias of 2 V, the APD exhibits a responsivity of 0.85 A/W; under a bias of 6.6 V, it achieves a 3-dB optoelectronic (OE) bandwidth of 51 GHz, a direct current gain of 27, and a maximum gain-bandwidth product (GBP) of 1377 GHz. High-speed performance is further confirmed through eye-diagram simulations at 100 Gbps non-return-to-zero (NRZ) and 200 Gbps four-level pulse amplitude modulation (PAM4). These results clearly show the strong potential of the proposed APD for optical communication and interconnect applications under stringent power and supply voltage constraints.
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