A Review of Optical Metrology Techniques for Advanced Manufacturing Applications

Advanced manufacturing places stringent demands on measurement technologies, requiring ultra-high precision, non-contact operation, high throughput, and real-time adaptability. Optical metrology, with its distinct advantages, has become a key enabler in this context. This paper reviews optical metrology techniques from the perspective of precision manufacturing applications, emphasizing precision positioning and surface topography measurement while noting the limitations of traditional contact-based methods. For positioning, interferometers, optical encoders, and time-of-flight methods enable accurate linear and angular measurements. For surface characterization, techniques such as interferometry, structured light profilometry, and confocal microscopy provide reliable evaluation across scales, from large structures to micro- and nano-scale features. By integrating these approaches, optical metrology is shown to play a central role in bridging macroscopic and nano-scale characterization, supporting both structural assessment and process optimization. This review highlights its essential contribution to advanced manufacturing, and offers a concise reference for future progress in high-precision and intelligent production.