Neural field enhanced phase retrieval of atomic-scale structural dynamics in radiation sensitive materials

Yang Liu1, Hongsheng Shi2, Siyuan Shen3

  • 1School of Information Science and Technology, ShanghaiTech University, Shanghai, 201210, China; School of Physical Science and Technology, ShanghaiTech University, Shanghai, 201210, China; Shanghai Key Laboratory of High-resolution Electron Microscopy, ShanghaiTech University, Shanghai, 201210, China.

Ultramicroscopy
|November 27, 2025
PubMed
Summary

Researchers developed a new phase retrieval method, combining neural fields (NF) and exit wave reconstruction (EWR), for high-quality atomic-scale imaging of radiation-sensitive materials using low-dose transmission electron microscopy (TEM). This EWR-NF technique reveals atomic details from minimal data, enabling precise analysis of delicate structures.