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Quantum-Enhanced Parameter Estimation in Multilevel Systems: Experimental Verification in a Superconducting Qutrit

Sai Li^1,2, Yuan-Ke Zhu¹, Wei-Xin Zhang¹

¹South China Normal University, Key Laboratory of Atomic and Subatomic Structure and Quantum Control (Ministry of Education), Guangdong Basic Research Center of Excellence for Structure and Fundamental Interactions of Matter, and School of Physics, Guangzhou 510006, China.

Physical Review Letters

|November 30, 2025

Summary

Researchers developed a new framework for quantum parameter estimation in multilevel systems. This method enhances measurement precision for multiple parameters, approaching the Heisenberg limit.

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Area of Science:

Quantum physics
Quantum metrology
Precision measurement

Background:

Quantum parameter estimation is crucial for precision measurement but limited in current two-level systems.
Multilevel quantum systems offer potential for diverse parameter measurement but face challenges under general quantum dynamics.

Purpose of the Study:

To propose a versatile framework for parameter estimation in multilevel quantum systems.
To experimentally demonstrate quantum-enhanced measurement of multiple parameters using a superconducting qutrit.

Main Methods:

Developed a framework for parameter estimation in multilevel systems under general quantum dynamics.
Utilized a superconducting qutrit sensor with two resonant microwave drives.
Coherently encoded parameters into the qutrit via microwave drives with distinct phases and amplitudes.

Main Results:

Achieved quantum-enhanced measurement of relative values between multiple parameters.
Demonstrated precise measurement of the ratio of two Rabi frequencies, phase sum, and phase difference.
Exhibited measurement precision approaching the Heisenberg limit.

Conclusions:

The proposed framework advances quantum metrology for high-precision measurements.
Enables resource-efficient measurements with broad applications in science and technology.
Opens new possibilities for utilizing multilevel quantum systems in metrology.