Analysis strategies for time-resolved X-ray solution scattering at high repetition rate XFEL sources

With the start of the user program at the European XFEL in 2017, and more recently with the LCLS-II upgrade, the X-ray repetition rate at X-ray free-electron lasers (XFELs) has been pushed into the kilo- and megahertz regimes. These high X-ray repetition rates provide an increase in the integrated flux at these facilities by orders of magnitude, potentially facilitating measurements that were previously infeasible due to signal-to-noise constraints. However, the high repetition rates lead to new challenges for sample delivery and a shorter time for the sample to recover between X-ray pulses. For solution-phase techniques, the X-ray-sample interactions will strongly perturb or even vaporize the sample jet. Although the sample can be replenished, up to X-ray repetition rates of ∼100 kHz, by flowing the jet at high speeds, this does not completely mitigate the jet perturbations. In this work, we present a characterization of the jet perturbations induced by the high X-ray repetition rates at the European XFEL. We show how these can introduce background signals in time-resolved X-ray solution scattering data measured at the Femtosecond X-ray Experiments (FXE) instrument. We show that it is possible to mitigate these experimental artifacts by employing an alternating excitation scheme combined with careful background subtraction and that implementing this approach in the experimental design outperforms more simple background subtraction schemes. The methodology, the observations and analysis results are discussed in relation to the evolving landscape of XFEL sources.