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Atomic Force Microscopy

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...

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High-Speed Atomic Force Microscopy Imaging of DNA Three-Point-Star Motif Self Assembly Using Photothermal Off-Resonance Tapping

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Molecular dynamic simulation of multi-frequency electrostatic force microscopy.

Quan Yuan¹, Jianqiang Qian¹, Yingzi Li¹

¹Beihang University, No. 37, Xueyuan Road, Hai dian District, Beijing, 100191, China.

Micron (Oxford, England : 1993)

|December 6, 2025

Summary

This summary is machine-generated.

Multifrequency electrostatic force microscopy (MF-EFM) simulations were enhanced by integrating electrostatic forces into molecular dynamics. This provides a reliable method for analyzing atomic-scale vibration responses in MF-EFM scans.

Keywords:

Electrostatic field simulation Molecular dynamics simulation Multifrequency electrostatic force microscopy

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Force Spectroscopy of Single Protein Molecules Using an Atomic Force Microscope

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Published on: February 28, 2019

Area of Science:

Materials Science
Surface Science
Nanotechnology

Background:

Multifrequency electrostatic force microscopy (MF-EFM) is vital for nanomaterial electrical characterization.
Accurate simulation of MF-EFM requires robust modeling of tip-sample electrostatic interactions.
Existing molecular dynamics simulations need adaptation for MF-EFM's electrostatic complexities.

Purpose of the Study:

To develop and validate a reliable method for simulating atomic-scale vibration responses in MF-EFM.
To investigate the influence of various parameters on tip response amplitudes in MF-EFM.
To bridge the gap between molecular simulations and experimental MF-EFM data.

Main Methods:

Utilized COMSOL Multiphysics to model the MF-EFM tip-sample system.
Derived a fitting formula for electrostatic forces between the tip and sample.
Implemented the derived forces within LAMMPS for molecular dynamics simulations.
Analyzed tip response amplitude variations and parameter effects on dual-mode amplitudes.

Main Results:

The simulation approach successfully explained the scan process of MF-EFM.
Simulation results were validated through experimental comparisons.
The study identified key parameters affecting tip response amplitudes in MF-EFM.

Conclusions:

A reliable computational method for simulating MF-EFM atomic-scale vibrations was established.
The integrated simulation approach enhances understanding of MF-EFM mechanisms.
This work facilitates more accurate electrical characterization of nanomaterials using MF-EFM.