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Compact Lens-less Digital Holographic Microscope for MEMS Inspection and Characterization
Published on: July 5, 2016
Jingze Zheng1, Yuncheng Wang1,2, Yiwen Chen1,2
1Key Laboratory of Photoelectronic Imaging Technology and System, School of Optics and Photonics, Beijing Institute of Technology, Beijing 100081, China.
Fourier ptychographic microscopy (FPM) full-field reconstruction is improved by a new suppressor tunable FPM (ST-FPM) method. This approach enhances image details and robustness, overcoming limitations of existing algorithms for digital pathology applications.
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