Simultaneous hard x-ray Talbot phase and dark-field imaging in laser experiments at XFEL facilities
V Bouffetier1, M P Valdivia2, L Ceurvorst3
1Helmholtz-Zentrum Dresden-Rossendorf (HZDR), D-01328 Dresden, Germany.
Abstract:
X-ray Free Electron Laser (XFEL) facilities offer unprecedented opportunities to advance instrumentation for studying matter under extreme conditions. In this study, we harnessed the enhanced x-ray capabilities of XFELs to demonstrate dark field imaging in laser-driven experiments at XFEL facilities. Utilizing a Talbot x-ray interferometer, we simultaneously captured transmission, dark-field, and differential phase contrast radiographs of laser-driven metallic foils. Our work showcases the feasibility of single-shot grating-based Talbot x-ray dark-field imaging in pump-probe experiments at XFEL facilities, opening doors to a wide range of hard x-ray imaging applications in material science and high-energy density physics.
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