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Updated: Jan 8, 2026

In Situ Detection and Single Cell Quantification of Metal Oxide Nanoparticles Using Nuclear Microprobe Analysis

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Published on: February 3, 2018

Discerning single atoms on TiO₂ nanoplatelets using STEM-based atomically-resolved secondary electron techniques.

Zhouhong Ren¹, Xian Li², Dongrun Xu³

¹School of Chemistry and Chemical Engineering, in-situ Center for Physical Sciences, Frontiers Science Center for Transformative Molecules, Shanghai Jiao Tong University, Shanghai, PR China.

Nature Communications

|December 12, 2025

Summary

This summary is machine-generated.

Advanced electron microscopy reveals secondary electron (SE) imaging complements annular dark-field (ADF) imaging for identifying single-atom catalysts (SACs). This technique enhances atomic-scale surface feature analysis on nanomaterials.

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Last Updated: Jan 8, 2026

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Atom Probe Tomography Analysis of Exsolved Mineral Phases

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Published on: October 25, 2019

Area of Science:

Materials Science
Surface Chemistry
Nanotechnology

Background:

Single-atom catalysts (SACs) are vital in heterogeneous catalysis for their high atomic efficiency.
Identifying the precise surface features of SACs at the atomic scale presents a significant challenge.
Current scanning transmission electron microscopy (STEM) techniques require complementary methods for detailed analysis.

Purpose of the Study:

To investigate single vanadium (V) and tungsten (W) atoms on TiO2 nanoplatelets using advanced STEM.
To evaluate the effectiveness of secondary electron (SE) imaging in conjunction with annular dark-field (ADF) imaging for SAC characterization.
To demonstrate a novel approach for atomic-scale surface analysis of supported single atoms.

Main Methods:

Utilized a probe-corrected scanning transmission electron microscope (STEM) for atom-resolved imaging.
Employed both secondary electron (SE) and annular dark-field (ADF) imaging modes.
Investigated single V and W atoms supported on TiO2 nanoplatelets.

Main Results:

Both V and W single atoms were clearly visualized using SE imaging.
Only W atoms were detectable using ADF imaging.
SE imaging provided Å-scale height and atomic mass contrast for supported single atoms.

Conclusions:

Secondary electron (SE) imaging offers valuable complementary contrast information for identifying single atoms on surfaces.
The combined ADF and SE imaging approach enables precise identification and differentiation of supported heteroatoms.
This research advances the characterization of single-atom catalysts, aiding future catalyst design and innovation.