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Xuanxuan Yang1, Yangming Zhang2, Haofeng Chen3
1Hefei Institutes of Physical Science, Chinese Academy of Sciences, 350 Shushanhu Road, Hefei, Anhui, 230031, China; Department of Precision Instruments and Precision Machinery, University of Science and Technology of China, 96 Jinzhai Road, Hefei, 230026, Anhui, China.
View abstract on PubMed
We introduce a novel framework for Electrical Impedance Tomography (EIT) that uses dual learning to improve conductivity imaging. This approach enhances reconstruction robustness and efficiency with sparse, noisy boundary data.
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