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Leaf Area Index Estimation Using Three Distinct Methods in Pure Deciduous Stands
Published on: August 29, 2019
Optimization of comprehensive wheat growth index system and monitoring model based on LAI
Mingguang Diao1, Shuning Liang2, Jianing Chen2
1School of Information Engineering, China University of Geosciences (Beijing), Beijing, 100083, China. dmg@cugb.edu.cn.
Abstract:
Wheat growth monitoring plays a vital role in agricultural decision-making and food security. This study aims to develop an accurate and efficient monitoring method for wheat growth by integrating satellite remote sensing and machine learning techniques. Based on preprocessed Sentinel-2 satellite images and measured wheat leaf area index (LAI) data, a set of 11 vegetation indices-such as NDVI, NDRE, and RVI-were selected and ranked through Pearson correlation analysis. A comprehensive index system was then constructed by selecting the top eight indices using a stepwise optimization approach. Three machine learning models-Linear Regression (LR), Backpropagation Neural Network (BPNN), and XGBoost-were applied to evaluate the performance of the index system, with the Particle Swarm Optimization (PSO) algorithm employed to optimize each model. The results demonstrate that the PSO-optimized XGBoost model achieved the highest accuracy (R² = 0.94, MSE = 0.075), exhibiting strong stability and robustness to data fluctuations. These findings suggest that the proposed approach provides a reliable solution for wheat growth monitoring.

