Identifying and Mitigating Adverse Xray Induced Effects in Operando Spectroscopic Studies of Copper Exchanged

Johannes Wieser1, Mark A Newton2, Przemyslaw Rzepka2

  • 1Department of Chemistry and Applied Biosciences, Institute for Chemical and Bioengineering, ETH Zurich, 8093 Zürich, Switzerland.

Summary

Researchers developed a mesh scanning technique to prevent X-ray damage during synchrotron experiments. This method ensures accurate data collection by rastering the X-ray beam, avoiding local overexposure and preserving sample integrity for reliable scientific conclusions.