Identifying and Mitigating Adverse X‑ray Induced Effects in Operando Spectroscopic Studies of Copper Exchanged
Johannes Wieser1, Mark A Newton2, Przemyslaw Rzepka2
1Department of Chemistry and Applied Biosciences, Institute for Chemical and Bioengineering, ETH Zurich, 8093 Zürich, Switzerland.
Researchers developed a mesh scanning technique to prevent X-ray damage during synchrotron experiments. This method ensures accurate data collection by rastering the X-ray beam, avoiding local overexposure and preserving sample integrity for reliable scientific conclusions.
Area of Science:
- Materials Science
- Analytical Chemistry
- Physics
Background:
- Synchrotron radiation is crucial for modern scientific research.
- Increasingly powerful X-ray sources pose a risk of beam-induced sample alterations.
- These alterations can compromise experimental data and lead to erroneous conclusions.
Purpose of the Study:
- To present a methodology for mitigating X-ray beam-induced effects during synchrotron experiments.
- To ensure the integrity of observed phenomena by preventing the observation method from causing alterations.
- To enable reliable operando measurements at advanced synchrotron facilities.
Main Methods:
- Implementation of a mesh scan technique, rastering the X-ray beam across the sample.
- Utilizing time-resolved X-ray absorption spectroscopy (XAS) to monitor changes in copper oxidation state.
- Investigating copper-exchanged zeolites under various atmospheric conditions (oxidizing, reducing, inert) as a function of X-ray dose.
Main Results:
- Beam-induced effects were observed at lower X-ray doses than previously reported for copper-exchanged zeolites.
- The mesh scan methodology effectively mitigates local overexposure and preserves sample integrity.
- Demonstrated the capability to conduct uncompromised operando measurements.
Conclusions:
- The mesh scan technique is a vital tool for accurate synchrotron-based research.
- This method ensures the full exploitation of state-of-the-art synchrotron facilities.
- Provides a reliable approach for obtaining uncompromised results in X-ray spectroscopy studies.
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