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Modeling trap dynamics in oxide-engineered heterostructure TFETs for breast cancer detection
1Institute for Microelectronics, TU Wien, Vienna, Austria. ghosh@iue.tuwien.ac.at.
Scientific Reports
|December 30, 2025
Summary
Interface traps in tunnel field-effect transistor (TFET) biosensors cause significant hysteresis and reduce accuracy for breast cancer detection. Reliability-aware modeling is crucial for stable and reproducible biosensing performance.
Area of Science:
- Semiconductor device physics
- Biosensor technology
- Biomedical engineering
Background:
- Tunnel field-effect transistors (TFETs) offer potential for low-power biosensing applications.
- Hysteresis caused by interface traps degrades the performance and reliability of TFET-based biosensors.
- Accurate modeling is needed to understand and mitigate trap-induced effects in biosensor design.
Purpose of the Study:
- To investigate the impact of interface traps on hysteresis in heterostructure oxide-engineered double-gated TFET biosensors.
- To analyze how trap location, sweep rate, and temperature affect TFET biosensor reliability and sensing stability.
- To introduce a metric for quantifying detection inaccuracy caused by reliability degradation.
Main Methods:
- Reliability-focused modeling of trap-induced hysteresis in TFET biosensors.
- Simulation of interface trap effects at InAs-Si and Si-SiO2 interfaces.
- Analysis of threshold voltage shifts, current sensitivity, and signal stability under varying conditions.
- Introduction and application of a novel detection inaccuracy metric.
Main Results:
- Interface traps significantly impact threshold voltage shifts, current sensitivity, and overall sensing stability.
- Trap location at critical interfaces (InAs-Si, Si-SiO2) leads to severe hysteresis and signal degradation.
- Detection inaccuracy can reach up to 97% for healthy biomarker conditions in degraded devices.
- Sweep rate and temperature influence the stability and reproducibility of TFET biosensor operation.
Conclusions:
- Reliability-aware modeling is essential for understanding and mitigating trap effects in TFET biosensors.
- Interface trap management is critical for achieving stable, reproducible, and accurate breast cancer detection using TFET biosensors.
- Simulation insights guide the optimization of TFET biosensor design for improved performance and reliability.
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