Modeling trap dynamics in oxide-engineered heterostructure TFETs for breast cancer detection

Rittik Ghosh1, Priyanka Saha2

  • 1Institute for Microelectronics, TU Wien, Vienna, Austria. ghosh@iue.tuwien.ac.at.

Scientific Reports
|December 30, 2025
PubMed
Summary

Interface traps in tunnel field-effect transistor (TFET) biosensors cause significant hysteresis and reduce accuracy for breast cancer detection. Reliability-aware modeling is crucial for stable and reproducible biosensing performance.