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Sample-Half-Inserted Quantum Interferometer
Wei Li1,2, Tao Xie1,2, Yu-Hang Luo2
1Hunan Normal University, Key Laboratory of Low-Dimensional Quantum Structures and Quantum Control of Ministry of Education, Department of Physics and Synergetic Innovation Center for Quantum Effects and Applications, Changsha 410081, China.
Physical Review Letters
|January 2, 2026
Summary
Researchers developed a novel sample-half-inserted Hong-Ou-Mandel interferometer (SHOM) that significantly boosts measurement precision. This quantum optics technique enhances Fisher information, enabling attosecond-scale temporal resolutions with fewer repetitions.
Area of Science:
- Quantum optics
- Quantum metrology
- Interferometry
Background:
- Quantum technologies offer unprecedented opportunities for ultrahigh precision metrology.
- The Hong-Ou-Mandel (HOM) interferometer enables temporal resolutions on the attosecond scale.
- Standard HOM measurements have low Fisher information, requiring extensive repetitions.
Purpose of the Study:
- To propose and demonstrate a sample-half-inserted HOM (SHOM) interferometer.
- To enhance Fisher information by 5 orders of magnitude in a single interference event.
- To convert a distinctive interference structure into a metrological resource.
Main Methods:
- Implementation of a sample-half-inserted HOM (SHOM) interferometer.
- Introduction of an asymmetric photon-sample interaction.
- Measurement of optical path difference using O(10^7) photons.
Main Results:
- Achieved an average precision of 4.09 nm (13.63 as) and accuracy of 1.22 nm (4.07 as).
- Demonstrated a 5-order-of-magnitude enhancement in Fisher information per trial.
- Observed a distinctive dip-bump-dip interference structure.
Conclusions:
- SHOM interferometry is an efficient, phase-insensitive approach for quantum-enhanced metrology.
- This technique paves the way for practical quantum-enhanced thickness measurement of transparent materials.
- SHOM serves as an elegant strategy to improve various quantum device performances.
