Overview of Microscopy Techniques
Scanning Electron Microscopy
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Updated: Jan 13, 2026

Scanning-probe Single-electron Capacitance Spectroscopy
Published on: July 30, 2013
Kim McKelvey1, Martin Andrew Edwards2, Minkyung Kang3,4
1MacDiarmid Institute for Advanced Materials and Nanotechnology, School of Chemical and Physical Sciences, Victoria University of Wellington, Wellington 6012, New Zealand.
This study presents a flexible, open-source scanning electrochemical probe microscopy (SEPM) instrument. This adaptable SEPM system enables various surface and interface analyses with minimal user programming, benefiting both new and expert researchers.
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Published on: June 27, 2022
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