STEM-EELS study of beam damage in polymers and extra-terrestrial organic matter using direct electron detectors

Sylvain Laforet1, Corentin Le Guillou1, Adrien Teurtrie1

  • 1Université de Lille, CNRS, INRAE, Centrale Lille, UMR 8207-UMET-Unité Matériaux et Transformations, F-59000 Lille, France.

Ultramicroscopy
|January 9, 2026
PubMed
Abstract