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Implicit neural network-based coal SEM super-resolution for enhancing micro-pores measurement tasks
Xiaowei An1, Shenghua Teng2, Zhuopeng Wang2
1College of Electrical Engineering and Automation, Shandong University of Science and Technology, Qingdao, 266510, Shandong, China.
Summary
This study introduces a new super-resolution (SR) framework using implicit neural representation and Half-Quadratic Splitting optimization to reduce radiation damage in Scanning Electron Microscopy (SEM). The method enhances image quality and ensures stability for precise measurements.
Area of Science:
- Materials Science
- Microscopy
- Computational Imaging
Background:
- Scanning Electron Microscopy (SEM) requires high resolution for detailed analysis.
- Prolonged radiation exposure during SEM can cause structural damage to specimens.
- Existing super-resolution (SR) methods may not adequately address radiation-induced artifacts or ensure measurement stability.
Purpose of the Study:
- To develop an interactive-interpretable super-resolution (SR) framework to mitigate radiation damage in SEM.
- To improve visual fidelity and geometric accuracy of high-resolution SEM images.
- To provide a stable and applicable solution for geometry-sensitive measurement tasks.
Main Methods:
- Integration of implicit neural representation (INR) with model-driven Half-Quadratic Splitting (HQS) optimization.
- Utilizing a local window attention mechanism within INR for contextual dependencies.
- Employing an interactive dual-branch network to decouple feature content and positional encoding.
- Unfolding the HQS algorithm into a deep, interpretable network for transparent optimization steps.
Main Results:
- The proposed SR framework significantly outperforms state-of-the-art SR algorithms in visual fidelity.
- Demonstrated applicability and stability in downstream geometry-sensitive measurement tasks.
- The method effectively addresses structural damage risks associated with prolonged radiation exposure in SEM.
Conclusions:
- The interactive-interpretable SR framework offers a robust solution for high-resolution SEM imaging under radiation.
- The integration of INR and HQS optimization enhances image quality while preserving geometric integrity.
- This approach is valuable for applications requiring precise measurements from radiation-exposed specimens.

