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Compositional Engineering for Low-Dark-Current Perovskite X-ray Detectors.

Mengpei Zhang1,2, Shuai Sun2, Wenjie Chen1,2

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|January 21, 2026
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Summary
This summary is machine-generated.

Researchers reduced dark currents in polycrystalline perovskite X-ray detectors by incorporating bromine (Br). This compositional tuning enhances material properties, leading to improved X-ray imaging performance for medical and industrial applications.

Keywords:
X-ray detectorX-ray imagingcompositional engineeringdark currentperovskite

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Area of Science:

  • Materials Science
  • Solid-State Physics
  • Medical Imaging Technology

Background:

  • Polycrystalline perovskites offer scalable processing for X-ray detection.
  • High dark currents limit the performance of current perovskite X-ray detectors.

Purpose of the Study:

  • To investigate the effect of bromine incorporation on perovskite composition.
  • To reduce dark currents in polycrystalline perovskite X-ray detectors.
  • To enhance X-ray imaging capabilities.

Main Methods:

  • Tuning the composition of methylammonium lead iodide (MAPbI3) by incorporating bromine (Br).
  • Characterizing the electrical properties, defect density, crystallinity, and recombination rates of the modified perovskites.
  • Fabricating and testing Br-doped perovskite X-ray detectors and integrating them into an X-ray imager.

Main Results:

  • Bromine incorporation modified the bandgap, increased electrical resistance, reduced defects, and improved crystallinity.
  • A 15% bromine doping concentration resulted in a bulk resistivity of 1.3 × 10^8 Ω·cm and a dark current density as low as 0.801 nA·cm^-2.
  • The Br-doped detector achieved a low detection limit (118.4 nGyair s^-1) and high sensitivity.
  • The integrated X-ray imager demonstrated high-quality imaging.

Conclusions:

  • Compositional tuning via bromine incorporation is an effective strategy to minimize dark currents in perovskite X-ray detectors.
  • The developed Br-doped perovskite X-ray detectors show significant potential for high-performance X-ray flat-panel imagers.
  • This approach facilitates advancements in industrial and medical X-ray imaging applications.